Download PDF by Jose Moreira: An Engineer's Guide to Automated Testing of High-Speed

By Jose Moreira

ISBN-10: 1607839830

ISBN-13: 9781607839835

Supplying a whole advent to the cutting-edge in high-speed electronic trying out with automatic try gear (ATE), this useful source is the 1st e-book to concentration completely in this more and more vital subject. that includes transparent examples, this one-stop reference covers all severe features of the topic, from high-speed electronic fundamentals, ATE instrumentation for electronic purposes, and try out and measurements, to creation trying out, aid instrumentation and textual content fixture layout.

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Additional resources for An Engineer's Guide to Automated Testing of High-Speed Interfaces

Example text

The challenge with this type of approach is the I/O cell design. Typically bidirectional interfaces are behind unidirectional interfaces regarding the maximum achievable data rate. 39 Comparison of unidirectional and bidirectional interfaces. 6 Hardware Building Blocks and Concepts This section provides a high-level description of the important building blocks of high-speed I/O cells. In a high-speed I/O interface, the most important building blocks are phase locked loops (PLL), delay locked loops (DLL), clock and data recovery (CDR), and equalization circuits.

A significant instant for a digital signal can be defined as the rising or falling edge from a bit transition crossing a voltage threshold level. 21 presents the most common jitter definition which is the time interval error (TIE), also sometimes referred to as the absolute jitter. 21 Standard definition of jitter on a digital signal, also referred to as time interval error (TIE) or absolute jitter. , the ideal positions for the rising and falling edges of the signal) is defined by a perfect reference clock.

While timing noise is referred to as jitter, voltage level noise is usually referred to as amplitude noise. 33. 32 Example of bounded uncorrelated jitter. 33 Amplitude noise to timing jitter conversion using a linear model. 5) where dV /dt is the slew rate of the digital signal. , the jitter histogram) but it is also possible to analyze jitter in the frequency domain. This approach can provide significant insights on the causes of the measured jitter. How to compute the jitter spectrum is directly related to the methodology used to measure the jitter.

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An Engineer's Guide to Automated Testing of High-Speed Interfaces by Jose Moreira


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