Download PDF by Jose Moreira: An Engineer's Guide to Automated Testing of High-Speed

By Jose Moreira

ISBN-10: 1607839830

ISBN-13: 9781607839835

Supplying a whole advent to the cutting-edge in high-speed electronic trying out with automatic try gear (ATE), this useful source is the 1st e-book to concentration completely in this more and more vital subject. that includes transparent examples, this one-stop reference covers all severe features of the topic, from high-speed electronic fundamentals, ATE instrumentation for electronic purposes, and try out and measurements, to creation trying out, aid instrumentation and textual content fixture layout.

Show description

Read Online or Download An Engineer's Guide to Automated Testing of High-Speed Interfaces PDF

Best microwaves books

Download PDF by Vojkan Vidojkovic, J. van der Tang, Arjan Leeuwenburgh,: Adaptive Multi-Standard RF Front-Ends (Analog Circuits and

This e-book investigates ideas, merits, boundaries, and prices linked to multi-standard operation of RF front-ends and their skill to conform to variable radio environments. subsequent, it highlights the optimization of RF front-ends to permit greatest functionality inside a definite strength finances, whereas concentrating on complete integration.

Modern Communications Receiver Design and Technology by Cornell Drentea PDF

This finished 462 pages textbook and reference with reference to radio frequency (RF) receiver layout provides the strategies, arithmetic and layout for such structures. Chapters comprise discussions on superheterodyne receivers, dynamic diversity, mixers, complicated coherent frequency synthesizers, computerized achieve keep watch over and beat frequency oscillators and extra sections hide complex subject matters like electronic sign processing (DSP) and software program outlined radios (SDR) in addition to digital battle (EW) receivers.

Download PDF by Sitangshu Bhattacharya: Effective Electron Mass in Low-Dimensional Semiconductors

This booklet offers with the potent Electron Mass (EEM) in low dimensional semiconductors. The fabrics thought of are quantum constrained non-linear optical, III-V, II-VI, hole, Ge, PtSb2, zero-gap, under pressure, Bismuth, carbon nanotubes, GaSb, IV-VI, Te, II-V, Bi2Te3, Sb, III-V, II-VI, IV-VI semiconductors and quantized III-V, II-VI, IV-VI and HgTe/CdTe superlattices with graded interfaces and powerful mass superlattices.

Download e-book for iPad: Elements of Mechanics by P.F. Kelly

The 1st quantity in a three-part sequence, parts of Mechanics offers a rigorous calculus-based creation to classical physics. It considers various phenomena in a scientific demeanour and emphasises the advance of constant and coherent versions guided via symmetry concerns and the applying of basic rules.

Additional resources for An Engineer's Guide to Automated Testing of High-Speed Interfaces

Example text

The challenge with this type of approach is the I/O cell design. Typically bidirectional interfaces are behind unidirectional interfaces regarding the maximum achievable data rate. 39 Comparison of unidirectional and bidirectional interfaces. 6 Hardware Building Blocks and Concepts This section provides a high-level description of the important building blocks of high-speed I/O cells. In a high-speed I/O interface, the most important building blocks are phase locked loops (PLL), delay locked loops (DLL), clock and data recovery (CDR), and equalization circuits.

A significant instant for a digital signal can be defined as the rising or falling edge from a bit transition crossing a voltage threshold level. 21 presents the most common jitter definition which is the time interval error (TIE), also sometimes referred to as the absolute jitter. 21 Standard definition of jitter on a digital signal, also referred to as time interval error (TIE) or absolute jitter. , the ideal positions for the rising and falling edges of the signal) is defined by a perfect reference clock.

While timing noise is referred to as jitter, voltage level noise is usually referred to as amplitude noise. 33. 32 Example of bounded uncorrelated jitter. 33 Amplitude noise to timing jitter conversion using a linear model. 5) where dV /dt is the slew rate of the digital signal. , the jitter histogram) but it is also possible to analyze jitter in the frequency domain. This approach can provide significant insights on the causes of the measured jitter. How to compute the jitter spectrum is directly related to the methodology used to measure the jitter.

Download PDF sample

An Engineer's Guide to Automated Testing of High-Speed Interfaces by Jose Moreira

by Steven

Rated 4.55 of 5 – based on 35 votes